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연구실 보유 장비 목록 - Probing Components
부품 및 장비명 모델번호 ▼ 제작업체 수량
 On-wafer Multi-Contact DC Probe(8pin,No cap,100um)     MCW-21-4195-A  GGB Industries (Picoprobe)   2  
 On-wafer Multi-Contact DC Probe(9pin,No cap,100um)     MCW-21-5415-1  GGB Industries (Picoprobe)   2  
 On-wafer Multi-Contact DC Probe (5 pin, 100um)     MCW-21-5415-2  GGB Industries (Picoprobe)   2  
 On-wafer Multi-Contact DC Probe (7 pin, 100um)     MCW-23-1602-1  GGB Industries (Picoprobe)   2  
 On-wafer Multi-Contact DC Probe (10 pin, No cap)     MCW-27-2723-1  GGB   1  
 On-wafer Multi-Contact DC Probe (4 pin, 100um)     MCW-31-3751-1  GGB INDUSTRIES, INC.   1  
 On-wafer Multi-Contact DC Probe (1 pin, 100um)     MCW-32-5780  GGB INDUSTRIES, INC.   2  
 High-Performance Linear Motorized Stage     MODEL M-VP-25XL-XYZR  Newport / MKS   1  
 Translation stage (XYZ)     MT3  THORLABS   1  
 Vibration Isolator     N/A     6  
 Microscope w/ CCD Camera     N/A  MS Tech   1  
 Rotation stage w/ mounting platform     RS65 w/ 38  Newport   1  
 Sliding Base     SB-2S  남일광학   8  
 Micrometer (13 mm)     SM-13  Newport   15  
 VERNIER MICROMETER     SM-13  NewPort   2  


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