작성일 : 11-10-11 22:13
[논문 Acceptance-EDL] Effects of Guard-Ring Structures on the Performance of Silicon Avalanche Photodetectors Fabricated With Standard CMOS Technology
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논문제목: Effects of Guard-Ring Structures on the Performance of Silicon Avalanche Photodetectors Fabricated With Standard CMOS Technology
논문저자: Myung-Jae Lee, Holger Ruecker, and Woo-Young Choi
저널명: IEEE Electron Device Letters
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